Aug 2010MAZeT GmbHRequest Info
JENA, Germany, Aug. 30, 2010 — For optical measuring tasks, Mazet GmbH is offering a tool for the simulation of compact spectral-selective semiconductor sensors for precise inline measurements. It yields shorter development times and better quality.
The system is simulated during the feasibility study using the tool optimized to meet the requirements presented. The simulation software enables choosing the right sensor and the optimal combination of filters and illumination in the preparatory phase to facilitate the best quality possible for the actual measurement. Various sensor models for color measurement cover a variety of precision requirements.
The combination is simulated and optimized on the basis of radiometric calculation rules. The simulation tool is suitable for validating the requirements of new and existing applications. Some optimizations that are highlighted can be easily implemented, for example, swapping the sensor lighting used or choosing objects for calibration.
The sensor models are suitable for simple teaching, RGB and XYZ sensors, absolute color measurement, multirange sensors, and radiometric measurements with multirange sensors. The spectral composition of the filters and lighting has the most significant affect on the quality of the measurement. The preliminary simulation eliminates the need for numerous optimization trials, for example, selecting the best light source while the system is still in development.