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  • Vortis SPM Control Station
Sep 2010
JPK Instruments AGRequest Info
BERLIN, Germany, Sept. 13, 2010 — JPK Instruments AG has announced the Vortis Advanced fully digital scanning probe microscope (SPM) electronics control system with low noise and high signal speed.

The company has used the new Power-PC hardware with the latest field-programmable gate array architecture to deliver high digital performance.

Vortis Advanced is available with all of the company's SPM systems, enabling the NanoWizard 3, the ForceRobot 300 and the CellHesion 200 to deliver even better results. With fast signal acquisition and control, advanced feedback and analysis are the keys for a modular and ultraflexible controller. The lowest noise levels are achieved using a new grounding concept, intelligent signal conditioning, temperature-stabilized oscillators and passive cooling.

The control station is supplied with a number of user-accessible analog and digital signal channels, fast responding lock-in amplifiers and high-end piezo drivers with closed-loop control. Flexibility of design gives the user the ability to work with different probe configurations that require various levels of control. For example, scanning tunneling microscope systems, systems using tuning forks and high-frequency cantilevers all need very specific control, all of which are delivered by the system, which also provides advanced synchronization with external instruments including spectrometers, potentiostats and optical detection devices.

Control systems also require powerful and modular software. The proprietary SPMControl v4 delivers ease of use and enables user-customized experiments through the implementation of many data analysis and processing routines such as multichannel oscilloscope functionality, advanced filtering, batch processing and channel overlay.


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