For solar photovoltaic (PV) cell testing applications, Craic Technologies Inc. has unveiled the 20/20 Solar microspectrophotometer, which is designed to measure the thickness of thin films as well as the optical efficiencies and clarity of photovoltaic cells. This can be done by both transmission and reflectance, whether the solar cells are the traditional crystalline silicon substrates or one of the thin-film varieties. Protective glasses and concentrator modules also can be analyzed for their efficiency. The device can be combined with proprietary contamination imaging capabilities to locate and identify process contaminants. It combines advanced microspectroscopy with sophisticated software to enable the user to measure transmissivity, reflectivity and luminescence. It can determine the thin-film thickness of many types of materials and substrates and can measure the transmissivity and reflectivity from many of the components used to manufacture PV cells, such as concentrators.