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PV Measurement Tool

Photonics.com
Nov 2010
Oriel InstrumentsRequest Info
 
STRATFORD, Conn., Nov. 3, 2010 — Oriel, a Newport Corp. brand, announced the release of a uniformity measurement tool for measuring the uniformity of irradiance at the sample plane of solar simulators.

The new PV tool is equipped with a single metal test platen, compatible with English and metric table mounts, and with all three test standards—IEC, ASTM and JIS. It features a detector head that is provided with appropriate masking to the area defined by either the IEC or the JIS method, depending on the model.

It is designed to correctly place the test detector head in 17 predetermined positions as defined by JIS standard C8912, or in 64 equally-spaced positions, defined by IEC method 60904-9.

Available in 2 x 2, 4 x 4, 6 x 6 and 8 x 8 models, the tool employs a user-friendly interface and manual test, as well as a built-in procedure guide.

Complete with intuitive MUMS software, the package provides 2- and 3-D surface plots to analyze XYZ positioning of the lamp to attain irradiance uniformity. The software also prompts the user to place the detector in the appropriate position and provides a real-time readout of percentage non-uniformity of irradiance, updated as each data point is measured.


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GLOSSARY
irradiance
Radiant flux incident per unit area of a surface. Also called radiant flux density.
masking
In image processing, the assigning of certain portions (or pixels) of an image a constant value of either 0 (black) or 1 (white) as to restrict image processing operations to a specific set of pixels within the image based off of its numerical assignment; also, the process of outlining an image and then matching it to test images.
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