NanoCam Sq Dynamic Profiler
Mar 20114D Technology Corp.Request Info
TUCSON, Ariz., March 1, 2011 — For 3-D measurement of surface roughness on large polished optics and optical quality surfaces, despite vibration or turbulence, 4D Technology Corp. has released the NanoCam Sq dynamic profiler.
The instrument replaces the slow, messy replication methods required by traditional workstation interferometers. By enabling on-machine roughness metrology, it reduces handling and transportation of the optic, increasing throughput and reducing the risk of damage to expensive, mission-critical optics.
It uses Dynamic Interferometry, incorporating a high-speed optical sensor that measures thousands of times faster than typical profilers, according to the company. Because acquisition time is so short, the NanoCam Sq can measure despite vibration, making it possible to mount the instrument in polishing equipment, on gantries or on robots. This freedom of positioning means that the instrument can measure any location on the surface of a large optic, and that the optic can be located anywhere, including on polishing equipment.
The complete system includes the profiler, computer system and 4Sight advanced analysis software that reports ISO 25178 surface roughness parameters and provides extensive 2- and 3-D analysis options, data filtering, masking, database and import/export functions.
Applications include surface roughness of large, coated and uncoated optics, on-machine surface roughness metrology, and process control for polishing operations.