Apr 2011EDAX Inc., Materials Analysis Div.Request Info
Edax Inc. has released the Apollo silicon drift detector series
for transmission electron microscopes. The line includes the Apollo XLT, with a
window that is super-ultrathin, and the Apollo XLTW, a windowless version. Data
acquisition and signal processing electronics are fully integrated into the detector.
For signal processors, the XLT eliminates the need for a separate electronics enclosure.
The integrated design improves performance, facilitates installation and offers
easy remote access via Ethernet from virtually any computer. With a 30 mm2 sensor,
the series offers good collection efficiency. The windowless version further maximizes
the collection efficiency and, for low-energy x-rays, increases sensitivity up to
500%. As a result, mapping speed and light detection are greatly enhanced at low