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MountainsMap 6.1 Software

Photonics.com
Apr 2011
Digital SurfRequest Info
 
BESANÇON, France, April 8, 2011 — Digital Surf SARL has released MountainsMap 6.1, the latest version of its surface imaging and analysis software for all types of surface metrology instruments, including confocal microscopes, white-light interferometers, scanning probe microscopes, and contact and noncontact profilometers.

With calculation speeds up to 16 times faster than MountainsMap 5.1 offered, and new features including universal data export, MatLab compatibility, multiscale wavelets filtering and analysis, second-generation lead analysis for the automotive industry and co-localization of images of the same surface generated by different instrument families, the new release provides extended interoperability in multiple surface metrology domains.

Multicore parallelization increases calculation speeds over version 5.1, and morphological filtering is two to eight times faster, form removal is three to four times faster, line-by-line correction of anomalous scan lines is eight to 16 times faster, and feature parameters are calculated four to eight times faster.

Universal ASCII data export means that metrologists, researchers and quality engineers can use everyday standard tools like Excel to post-process any set of MountainsMap 6.1 results to meet specific requirements. And researchers benefit from greater flexibility when presenting results and publishing them in accordance with varying editorial guidelines.

Users can write and execute MatLab scripts in MountainsMap 6.1 to apply their own operators to measurement data sets. They can develop and apply custom filters for specific purposes.

Version 6.1 includes new or enhanced modules that integrate wavelets filters and analyses, carry out lead analysis in accordance with a standard developed by Mercedes-Benz that has been adopted by the automotive industry, and co-localize topography and fluorescence images in life sciences applications.

The wavelets optional module enables multiscale analysis on profiles and surfaces to detect the scale on which phenomena occur. ISO 16610 spline wavelets are available. The user can visualize profiles and surfaces at each scale before selecting the boundary between high-pass roughness scales and low-pass waviness scales.

The lead analysis (Twist) optional module implements second-generation lead analysis in the automotive industry in accordance with the Mercedes-Benz Engineering Standard.

The image co-localization optional module that co-locates images from different instruments (for example, atomic force microscope images with fluorescence images or confocal microscope topography images with scanning electron microscope images) has been extended with new options.

Other new features include easier parameter selection, streamlined extraction of subsurfaces for independent analysis, more precise line-by-line correction of anomalous scan lines, extended visualization of correlations between multichannel topography, color and intensity images, enhanced force curve analysis and new contour parameters. The addition of Brazilian Portuguese brings the number of supported languages to 10.


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