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Atomic Force Microscope

Photonics Spectra
Jul 2011
Bruker Nano SurfacesRequest Info
 
The Dimension FastScan atomic force microscope (AFM) from Bruker Corp. delivers good imaging speed without sacrificing nanoscale resolution. It produces results in seconds or minutes instead of hours or days. The system performs large-sample atomic-scale imaging across the scientific, biological, semiconductor, data storage and energy research markets. Innovations enable fast scan speeds, high image resolution and accuracy. Based upon the Dimension Icon AFM architecture, the microscope is a tip-scanning system that provides measurements on large and small samples in air or fluids. The system uses an X-Y-Z closed-loop head that scans at high speeds while delivering low drift and low noise. A new fast scanner, a high-resolution camera, automated laser and detector alignment, and integrated feedback alignment tools deliver fast probe positioning and sample navigation.


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