WESTERVILLE, Ohio, Aug. 29, 2011 — Lake Shore Cryotronics Inc., in collaboration with Toyo Corp. of Japan, has introduced the 8400 series Hall effect measurement system with optional AC field measurement capability. Hall mobilities down to 0.001 cm2/V can be measured, lower than is possible using traditional DC field Hall measurement techniques. Semiconductor and electronic materials are being developed for applications including green energy, efficient lighting, flexible inexpensive electronics and high-power devices. This emerging class of photovoltaic, thermoelectric and organic electronic materials is characterized by low mobilities that are difficult to measure. The DC field Hall measurement technique has been sufficient to measure materials with mobilities down to ~1 cm2/V, but it is challenging to extract the diminishingly small Hall voltage from the background noise that is produced by such materials. To close the gap between traditional DC field measurement techniques and these low-mobility materials, the 8400 Series system has an AC field Hall measurement option that can measure mobilities down to 0.001 cm2/V. The system is equipped with DC field measurement capabilities and a resistance range from 0.5 mΩ to 10 MΩ. Options including AC field capability, variable temperature assemblies, high resistance and low resistance are available to broaden the measurement opportunities and simplify experimental processes. The Model 8404 Hall effect measurement system provides a robust platform to which new features can be added as material measurement needs evolve.