SOUTHINGTON, Conn., Nov. 1, 2011 — For fast and efficient automated optical inspection of solar wafers, Baumer Ltd. USA has introduced its HXC20NIR and HXC40NIR CMOS cameras, which measure electroluminescence and deliver high sensitivity in the near-infrared spectrum. The company says that the cameras are twice as sensitive as monochrome technology at a wavelength of 900 nm, using electroluminescence to effectively detect fractures and failures in the crystal structure of the solar wafer. The images produced yield information on the integrity and effectiveness of each wafer prior to the next processing step. Structural defects within the wafer can be easily detected, enabling better quality control. The HXC40NIR model offers 2048 × 2048-pixel resolution with a 1:1 aspect ratio. The high resolution means that fewer cameras can be used to inspect complete modules, simplifying and reducing the cost of inspection. Good image quality with low readout noise is ensured by the global shutter sensor with correlated double sampling developed by CMOSIS. The HXC20NIR produces 2048 × 1018-pixel resolution. The cameras support several image formats with up to 12 bits per pixel and are equipped with a flexible Camera Link interface that permits high frame rates in base (three taps) and full (10 taps) modes. The robust, industrial design makes them reliable, and an optimized thermal concept enables their use in an expanded temperature range.