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  • Innova-IRIS TERS-Ready AFM System
Dec 2011
Bruker Nano SurfacesRequest Info
TUCSON, Ariz., Dec. 1, 2011 — Bruker Corp.’s Nano Surfaces Div. has released the Innova-IRIS, an integrated system for correlated atomic force microscopy (AFM) and Raman spectroscopic imaging. Its ultralow closed-loop noise, no-drift mechanical stability and wide-open optical access make it a suitable platform for tip-enhanced Raman spectroscopy (TERS) research. With hardware integration designed to accelerate a TERS setup, and an IRIS software module that offers automated mapping, the system transforms AFM and Raman instruments into TERS-enabled research platforms.

The company says that researchers have had to accept severe performance limitations to combine atomic force microscopy with Raman spectroscopy, and there has been a need for commercial products that allow more scientists to perform these complementary techniques.

Recent company innovations have made AFM easier to use. The Innova-IRIS system provides a solution for routinely correlating AFM nanoscale property maps with Raman chemical images to address nanoscale materials analysis applications and to enable TERS research to expand.

The system leverages the performance and AFM head design of the Innova platform to provide TERS-ready AFM-Raman integration suitable for sensitive interrogation of opaque samples. It is compatible with leading Raman systems, and it implements the optimized off-axis Raman geometry necessary for maximum sensitivity.

With multiple simultaneous optical views, simplified approach curves for TERS signal evaluation and automated mapping, the integration accelerates setup and data acquisition and preserves the performance and capabilities of each instrument in separate operation. It provides fully featured analysis packages for the AFM and Raman data.


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tip-enhanced Raman spectroscopy
A spectroscopic technique that combines the high chemical specificity of Raman scattering and signal sensitivity provided by surface plasmon resonance enhancement, with the nanoscale spatial resolution of scanning probe microscopy (SPM). Supported by a sharp metallized-SPM tip, tip-enhanced Raman spectroscopy (TERS) enables label-free detection of surface components in multicomponent samples with ultrahigh spatial resolution, making it suitable for studying nanomaterials.
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