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TO-Can Laser Diode Test System

Photonics.com
Jan 2012
Yelo LimitedRequest Info
 
CARRICKFERGUS, Northern Ireland, Jan. 24, 2012 — Yelo Ltd. has designed a burn-in system to test the reliability of TO-can laser diodes. The company’s research and development engineers have reduced the time taken to stabilize devices at test temperature and to provide even temperature control across all devices.

The systems reduce test time by 25%, and they automatically take LIV measurements on the lasers during the test and save the data. Extensive graphing is built into the graphical user interface software, so time-consuming post data analysis is unnecessary.

Secure remote access allows test engineers to see the data without leaving their desks. Constant current and constant power modes are standard in the software.

Two models are available, each unique in its testing environment and functionality. The Laboratory Tester model can be used to life-test devices and improve test recipes. The Production Tester is used as a simple pass-fail system in manufacturing environments.


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