Anasys Instruments Corp. has launched the afm+ fully integrated atomic force microscopy (AFM) platform, which offers important analytical capabilities. Using thermal probe technology for nanoscale thermal analysis (nano-TA), the afm+ allows the user to obtain transition temperatures on any local feature of a sample, or to obtain a transition temperature map. It facilitates measurement of glass transition temperatures and melting temperatures. This mode includes scanning thermal microscopy, which allows the user to map relative thermal conductivity and relative temperature differences across the sample. Transition temperature microscopy is used to quantify and map thermal transitions in heterogeneous materials. The afm+ can be fully upgraded to perform nanoscale infrared spectroscopy for measuring and mapping chemical composition. Potential application areas include the life sciences.