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SEM Upgrade

Photonics.com
Jul 2012
JEOL USA Inc.Request Info
 
PEABODY, Mass., July 16, 2012 — Since its introduction in 2008, JEOL USA Inc.’s NeoScope benchtop scanning electron microscope (SEM) has been used for inspection of electronic parts, forensics analysis, pharmaceutical inspection and imaging insects for student projects. It is also used in conjunction with optical microscopes and traditional SEMs in the lab.

Now available with higher magnification, multitouch screen control and a sleek new design, it is as simple to use as a digital camera. The high-resolution SEM produces images with a large depth of field at magnifications ranging from 10× to 60,000×. It features high- and low-vacuum operation, three selectable accelerating voltages, and secondary electron and backscattered electron imaging. The NeoScope accommodates samples up to 70 mm in diameter and 50 mm in thickness. Conductive and nonconductive samples can be examined.

The touch-screen interface has the familiar look and feel of today’s smart phones and touch pads. Automatic functions as well as prestored recipe files make it easy to use for a multitude of sample types. Any skill level of user will appreciate the simplicity and fast operation, from sample loading to imaging in vacuum in <3 min.


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