Request InfoRudolph Technologies Inc.FLANDERS, N.J., Aug. 8, 2012 — Rudolph Technologies Inc.’s MetaPULSE FP thin-film metrology system is used by manufacturers of flat panel displays for handheld mobile devices, such as tablets, electronic book e-readers and smartphones. The system uses proprietary PULSE (picosecond ultrasonic laser sonar) technology to measure the critical thickness of metal layers deposited during the manufacturing process. The system enables measurement on actual product structures without contacting or destroying the device. PULSE technology’s ability to provide noncontact, nondestructive, on-product measurements...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 5/13/2022Metrology and Surface Imaging Software PlatformThe fully 64-bit TrueMap® 6 software platform for surface imaging and analysis from TrueGage contains multi-threaded algorithms, a redesigned user interface, and new capabilities. 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