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TERS Probes

Photonics.com
Dec 2012
Bruker Nano SurfacesRequest Info
 
TUCSON, Ariz., Dec. 4, 2012 — Bruker Corp. has released a line of IRIS TERS probes. By enabling tip-enhanced Raman spectroscopy (TERS), the probe tips provide nondestructive label-free chemical detection at the nanoscale.

As sharp, solid-metal cones, the probes deliver high Raman enhancement, which translates to high sensitivity and spatial resolution. Together with the proprietary Innova-IRIS system and third-party research Raman systems, the probes create a complete commercial TERS solution.

With their proven TERS contrast capability, they move atomic force microscopy (AFM) beyond just imaging. All existing Innova-IRIS systems require only a new cartridge to start using the probes, and any existing Innova can be upgraded to an Innova-IRIS AFM/Raman system.

Used on the Innova-IRIS, the probes enable TERS on opaque samples using scanning tunneling microscopy feedback. Made of solid gold, they are optimized for high TERS enhancement at red and near-infrared Raman excitation wavelengths. They retain their high enhancement over a long shelf life.


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GLOSSARY
tip-enhanced Raman spectroscopy
A spectroscopic technique that combines the high chemical specificity of Raman scattering and signal sensitivity provided by surface plasmon resonance enhancement, with the nanoscale spatial resolution of scanning probe microscopy (SPM). Supported by a sharp metallized-SPM tip, tip-enhanced Raman spectroscopy (TERS) enables label-free detection of surface components in multicomponent samples with ultrahigh spatial resolution, making it suitable for studying nanomaterials.
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