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Quality Control Microscope

Photonics.com
Feb 2013
Leica Microsystems GmbHRequest Info
 
WETZLAR, Germany, Feb. 25, 2013 — For routine inspection and quality control, Leica Microsystems GmbH has launched the DM2700 M materials microscope. Applications include metallography, earth science, forensic investigation and materials research. It offers state-of-the-art universal white-light LED illumination with high-quality Leica optics.

The ultrabright, high-power LED illumination provides a constant color temperature of 4500 K for bright-field, dark-field, interference contrast and polarized light methods. Users can better visualize surface details with built-in oblique illumination technology. Real-color imaging with all brightness intensity levels is achieved via the long lifetime and low power consumption of LED illumination.

Reduced risk of error and ease of operation result from the proprietary and intuitive color-coded diaphragm assistant. Users are guided through the basic settings of resolution, contrast and depth of field, ensuring accuracy and repeatability. Greater comfort and productivity are achieved by the built-in focus stop, the height-adjustable focus knobs and the three-gear focusing mechanism.

For inspection, process control and defect analysis of electronic components, the microscope offers high optical resolution to detect small defects on a sample. The constant color temperature of the LED illumination allows users to always see the sample in the same color. The ergonomic design makes it suitable for laboratory environments and helps prevent muscular tension and fatigue. Intuitive operation means that the microscope adapts easily to various user levels. The robust stand makes it suitable for challenging working conditions in industrial quality control.


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GLOSSARY
metallography
The analysis of metal structure using an optical or electron microscope, generally with a camera, to record observations.
oblique illumination
A common technique in microscopy, oblique illumination is one in which the object is illuminated by a light source that is at an oblique angle (on the side) to the optical axis. This technique is often used to highlight otherwise visible structures as well as giving the image a three dimensional appearance.
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