JENA, Germany, June 19, 2013 — Made for adapting onto the top of standard X-Y microscopy stages, the PZ 300 AP Z-axis elevator stage from piezosystem jena has two parallel working piezo drives that allow the centrically located microscopy probe adapter to be lifted symmetrically. The device is suitable for laser scanning microscopy and other techniques such as fluorescent, superresolution and image processing. The stage’s flat design can be used for standard microscopes or for inverted stands. The monolithic stage design is free of mechanical play and offers a travel range of up to 300 µm, a step resolution of ±2.5 nm and a settling time under a load of a few milliseconds. The quick and precise positioning of probes allows users to make measurements and carry out line scans with greater speed and to reach a better signal quality for their results. Containing a large free aperture, the piezo stage works with standard slides, multiwell plates and Petri dishes. It can be equipped with integrated feedback sensors for closed-loop positioning control and can store specific positions, which can be approached repeatedly with accuracy in the nanometer range.