Request InfoBruker Nano SurfacesBruker Corp. has introduced the LumiMap electroluminescence system for optical and electrical characterization on epitaxial (epi) growth wafers for high-brightness (HB) LEDs. An alternative to conventional indium dot methods of epi wafer characterization, the system features nondestructive measurement requiring no chemical cleaning afterward; software-controlled measurement locations; and repeatable optical and electrical measurement capabilities through forming a temporary LED device on an epi wafer. The results correlated with those on the final HB-LED, providing an early warning of...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra May 2023 IssueOptical ProfilometerThe NPFLEX-1000 optical profilometer from Bruker Corp. features large form-factor gantry and robust bridge architecture for fast, automated areal measurements of surface texture and roughness. ...Photonics.com 2/14/2023Optical ProfilometerThe ContourX-1000 from Bruker Corp. is a white-light interferometry system that enables fast, automated areal measurements of surface texture and roughness. It features patented tip/tilt head,...BioPhotonics Nov/Dec 2023 IssueDigital Focus ModuleThe NeuraLeap™ digital focusing module from Bruker is a digital micromirror device (DMD) which enables variable depth-of-field collection for advanced neuroscience research. 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