HILLSBORO, Ore., Nov. 5, 2013 — The Tecnai Femto ultrafast electron microscope from FEI Co. captures ultrafast events and processes measured in femtoseconds, including the absorption of light energy and its transformation into heat, or mechanical changes and the crystallization or recrystallization of materials. Ultrashort laser pulses stimulate a brief flash of photoelectrons from the electron source, and a pulse of laser energy directed at the sample acts as a stimulus. The device achieves high temporal resolution operating in stroboscopic mode by combining images of the sample at a given delay between stimulus and flash. The delay is then adjusted incrementally and another image is acquired, resulting in a sequence of images. For irreversible processes such as fractures, the instrument can be operated in single-pulse mode with many electrons in the pulse. It also can be operated in continuous-beam transmission electron microscope mode.