Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
SPECIAL ANNOUNCEMENT
2016 Photonics Buyers' Guide Clearance! – Use Coupon Code FC16 to save 60%!
share
Email Facebook Twitter Google+ LinkedIn

MiXcroscopy Correlative Imaging

Photonics.com
Mar 2014
JEOL USA Inc.Request Info
 
PEABODY, Mass., March 28, 2014 — The Nikon ECLIPSE LV-N series optical microscope and the JEOL JSM-7000 series field emission scanning electron microscope work concurrently, allowing researchers to observe detailed structures at higher magnifications and to compare them to the optical image on the screen.

The integrated devices from MiXcroscopy enables seamless, rapid observation and navigation of the same region on a sample. It features the same specimen holder for optical microscopy and scanning electron microscopy, and the specimen stage registration is fully controlled by Nikon’s dedicated Elements software.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2016 Photonics Media
x We deliver – right to your inbox. Subscribe FREE to our newsletters.