Oct 2014Industrial Technology Research InstituteRequest Info
HSINCHU, Taiwan, Oct. 30, 2014 — Offering a measurement rate of 12,000 LEDs per hour, the In-Line Compact Thermal Analyzer from the Industrial Technology Research Institute reduces LED thermal testing time by more than 90 percent.
The analyzer is 2000 times faster than traditional lab methods, reducing each LED’s component thermal testing time to 0.3 seconds. Critical thermal characteristics are offered, such as junction temperature and thermal resistance for semiconductor devices like LEDs, high-electron-mobility transistors, metal-oxide-semiconductor field-effect transistors and insulated-gate bipolar transistors.
Manufacturers can now screen defective products on production lines in real time, optimizing production processes and increasing efficiencies to reduce defect rates for LED lighting.