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Inspection Software

Photonics.com
Jan 2015
Carl Zeiss Jena GmbHRequest Info
 
JENA, Germany, Jan. 29, 2015 — Zeiss AutoAnalysisZeiss has announced new semiconductor inspection software, AutoAnalysis.

The software provides fully automated analysis of aerial images in parallel to the measurements as they are being captured using the company’s AIMS (Aerial Image Measurement Software) systems.

AutoAnalysis results are automatically entered into customized report layouts.


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