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Beam-Handling Systems

Photonics.com
Mar 2015
OWIS GmbH, Optical Beam Handling & Positioning SystemsRequest Info
 
STAUFEN, Germany, March 17, 2015 — OWISets PRAKThree OWISets PRAK beam-handling systems from Owis are designed for experimental setups at institutes, universities and colleges.

Each is based on standard components from the company’s SYS 65 system. Sets may be used for determining different focus lengths, diffraction at a grid and Mach-Zehnder interferometry.

For implementation of specific setups, the OWISets can be individually configured or adapted. The sets are expandable and can be combined with other Owis components.


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GLOSSARY
interferometry
The study and utilization of interference phenomena, based on the wave properties of light.
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