Scanning-Slit Beam Profiler
Nov 2015Ophir - Spiricon LLC, PhotonicsRequest Info
NORTH LOGAN, Utah, Nov. 4, 2015 — Ophir Photonics, part of Newport Corp., has announced the NanoScan 2s, a high-power, scanning-slit beam profiler.
The NIST-calibrated profiler instantly measures beam position and size with submicron precision for CW and kilohertz-pulsed lasers. It offers silicon, germanium or pyroelectric detectors, which allow profiling lasers of any wavelength from UV to far-infrared, 100 μm and beyond.
Moving slits measure beam sizes from microns to centimeters at beam powers from microwatts to kilowatts. A digital controller provides deep, 16-bit digitization of the signal for high dynamic range up to 35 dB, making it possible to measure beam size and beam pointing with 3σ precision to several hundred nanometers.
NanoScan 2s software can measure between 1 and 16 beams in the aperture with submicron precision. A beam can be found in less than 0.3 seconds, with real-time updates displayed at 20 Hz.