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Wafer Probing Service

Photonics.com
Dec 2015
VI Systems GmbHRequest Info
 
BERLIN, Dec. 10, 2015 — VI Systems GmbH offers high-speed electrical and optical testing of wafers early in the manufacturing process using a semiautomatic wafer probing station.

The system reduces manufacturing costs by eliminating out-of-specification wafers before they have been cut and packaged to improve yield.

It also offers high-speed characterization at the wafer level. Test parameters include optical output power and optical spectrum. Electrical parameters include operation voltage, bias voltage, drive current and dark current. In addition, a high-frequency characterization test of up to 38 GHz can be performed including digital transmission experiments of up to 64 Gb/s.


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