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THIN-FILM MEASUREMENT

Photonics Spectra
Sep 2000
Filmetrics Inc.Request Info
 
Filmetrics Inc. has introduced two systems for nondestructive measurement of samples on curved surfaces. The products measure two-layer structures and optical constants. The F20-CP is designed to measure translucent or clear reflective coatings and curved surfaces of film up to 50 µm thick, while the F20-XT, with the CP-NIR contact probe attachment, can measure film up to 100 µm thick. The systems require no sample preparation and can fit on a desktop. They also sample with accuracy to within 1% in less than 1 s and either on- or off-line.


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