Cold FEG
JEOL USA Inc.Request Info
A new cold field emission gun (FEG) from JEOL USA Inc. enhances
the ultrahigh atomic-level resolution of the company’s JEM-ARM200F aberration-corrected
scanning/scanning transmission electron microscope. Now outfitted with the optional
and field-retrofittable cold FEG, the JEM-ARM200F has ultrahigh imaging resolution
that is guaranteed at 78 pm with an energy resolution of 0.3 eV. The higher brightness
and smaller source size of the cold FEG produce a smaller, sharper electron probe
with a larger probe current, resulting in enhanced atom-by-atom imaging and chemical
analysis. The addition of a cold FEG to the ARM family adds another dimension to
the company’s capability for atomic-scale imaging and characterization. This
enhancement enables performance of subangstrom imaging and atomic column chemistry
with accuracy, speed and ease.
https://www.jeolusa.com
/Buyers_Guide/JEOL_USA_Inc/c7365
Published: October 2010
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to JEOL USA Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required