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IR AFM Imaging at Nanometer-Scale

Molecular Vista Inc.Request Info
 
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SPIE Optics & Photonics 2015 Booth: 339

IR AFM Imaging at Nanometer-ScaleVistaScope provides infrared spectral images with topography via photo-induced force microscopy (PiFM). Operated in air, PiFM provides chemical specificity at nm-scale even on samples difficult for electron microscopes, such as polymers (image highlights individual polymeric species and topography in PS-b-PMMA).


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ImagingTest & MeasurementSPIE Optics & Photonics 2015Productsindustry

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