WAFER ANALYZER
Malvern Panalytical Inc.Request Info
PANalytical has launched the 2830 ZT, a wafer analyzer that performs simultaneous noncontact determination of layer thickness and composition on wafers up to 300 mm. The wavelength dispersive x-ray fluorescence instrument also determines contamination, dopant levels and surface uniformity, and it measures up to 24 elements on stacks of up to 16 layers. It operates at a constant current of 160 mA and is supplied with the company’s SuperQ software.
https://www.malvernpanalytical.com
/Buyers_Guide/Malvern_Panalytical_Inc/c11377
Published: March 2009
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