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Test & Measurement Products
RADIATION MEASUREMENT
May 1, 1998 — Solar Light Co.'s Microtops II handheld meter calculates total column ozone thickness by measuring direct solar UV radiation at three wavelengths in the UVB range. It also can be configured to measure total water vapor and aerosol optical thickness. The instrument features an on-board clock and calendar, a built-in barometer, nonvolatile memory storage of raw data and results of up to 800 measurements. Users can plug in an optional global positioning system receiver to update the instrument's...
Solar Light Co. LLC
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VARIABLE ATTENUATOR
May 1, 1998 — Santec Corp. has announced its OVA-20M and OVA-30M miniature optical variable attenuators. They can be built into a variety of optical communication and measurement systems including WDM applications. They employ neutral density filters with high...
Santec USA Corp.
DLC ANALYZER
Apr 1, 1998 — Renishaw plc has developed a quality control system that uses Raman spectroscopy to determine diamond-like-carbon film parameters such as film thickness, hydrogen content and chemical bonding of the carbon. The measurements are performed with no...
Renishaw PLC, Spectroscopy Products Div.
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TIME MEASUREMENT
Apr 1, 1998 — Berkeley Nucleonics Corp. has unveiled an eight-channel time-to-digital converter module. The B980 module is packaged as a single width, 6U VME module with less than 50-ps resolution and 70-ps jitter. It has two modes of operation. In the time...
Berkeley Nucleonics Corporation
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LAMP MEASUREMENT
Mar 1, 1998 — The BLS1000 and BLS1800 lamp measurement systems from Bentham Instruments Ltd. are equipped with 1.0- and 1.8-m-diameter integrating spheres, respectively. The systems are available with a variety of lamp holders for miniature incandescent, compact...
Bentham Instruments Ltd.
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LASER VIBROMETER
Mar 1, 1998 — MetroLaser Inc.'s VibroMet is a laser vibrometer system designed for noncontact, single-point vibration measurements. Based on the company's optical and electronic configuration, the compact device can detect vibration amplitudes as low as 0.02 nm...
MetroLaser Inc.
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SURFACE MEASUREMENT
Mar 1, 1998 — Fisba Optik, represented by Breault Research Organization Inc., offers its Twyman-Green phase-shifting interferometers. The Fisba µPhase MicroInterferometer, with a base unit the size of a matchbox, has a modular design for easy adaptation to the...
Breault Research Organization Inc.
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VME COMPUTERS
Mar 1, 1998 — National Instruments has released its family of 6U, Intel Pentium-based, embedded VME computers that are compatible with the leading test and measurement software. The VMEpc-600 series includes the VMEpc-650/233, based on the 233-MHz Pentium MMX...
National Instruments Corp.
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PHOTON COUNTING
Feb 1, 1998 — The Time Harp 100 single-photon counting board from PicoQuant GmbH is a complete system for time-resolved measurements on a single PC card. The solid-state design cuts costs, improves reliability and simplifies calibration. The circuit allows...
PicoQuant GmbH
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DIODE MEASUREMENT
Jan 1, 1998 — Gradient Lens Corp.'s LARS/200 diode laser measurement system will be made and marketed by LaserMax Inc. as Nano-Trak. This self-contained system, which eliminates the need for separate lasers, interferometers, receivers and electronics modules, can...
Gradient Lens Corp.
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DOPPLER VELOCITY INTERFEROMETER
Jan 1, 1998 — The DVI 99 noncontact velocity recording system from Martin, Froeschner & Associates detects spontaneous changes in the frequency of light reflected from a moving surface. This turnkey system, which is housed in a 3-in. rack-mounted chassis, is...
Martin, Froeschner & Associates
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OPTICAL POWER METER
Jan 1, 1998 — EXFO E.O. Engineering Inc. has developed an optical power meter, the PM-1100, with a dynamic range of 110 dB. The device allows the user to store up to 512 readings and up to 1024 data points. Standard GPIB and RS-232 interfaces are supplied along...
EXFO Inc.
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FO LIGHT SOURCE
Dec 1, 1997 — The ALS-06 offered by Ancal Inc. is a fiber optic light source designed to provide reliable illumination for spectroscopic and radiometry measurements. The system includes a high-intensity quartz halogen lamp, a soft start circuit, a regulated power...
Ancal Inc.
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INTERFEROMETER
Dec 1, 1997 — Blue Sky Research's Laser Wave Analyzer provides users with information about the quality of a laser beam. The dual shearing interferometer system displays wavefront phase and aberrations, beam intensity and profile, and far-field characteristics....
Blue Sky Research
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POWER METER
Dec 1, 1997 — A new handheld laser power meter is available from Coherent. The LaserCheck is microprocessor-controlled, with wavelength correction, autoranging, and sample and hold functions. Its rugged, ergonomic design allows single-button power measurements in...
Coherent Inc.
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FLATNESS MEASUREMENT
Sep 1, 1997 — Lapmaster International has issued a 36 3 24-in. wall chart that details the principles of using light bands and how to interpret them for measuring flatness in conjunction with monochromatic light. The use and maintenance of optical flats, and...
Lapmaster Wolters Ltd.
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LASER DIODE PARAMETER EXTRACTOR
Sep 1, 1997 — Photon Design is offering LASFIT, a laser diode parameter extractor program designed to extract as much data as possible from simple experimental measurements on a distributed feedback (DFB) laser. After the user supplies one measurement of a...
Photon Design
MEASUREMENT PROBE
Sep 1, 1997 — Star Tech Instruments Inc. has developed the HT-500C probe for measuring the uniformity of high-power lamps at the wafer plane. This instrument was designed to operate at temperatures up to 500 °C without loss of accuracy. Other features include 5%...
Star Tech Instruments Inc.
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ROUGHNESS MEASUREMENT
Sep 1, 1997 — A module for the analySIS image analysis and processing software package from Synoptics Ltd. calculates the fractal dimension of a particle edge, giving a quantitative description of the particle structure or shape. This allows subjective...
Synoptics Ltd.
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PULSED RANGEFINDER
Jul 1, 1997 — A pulsed laser rangefinder with a glass-fiber-coupled remote optical head and split optics design is offered by Riegl Laser Measurement Systems. The company's LD90-3100 EHS-GF and LD90-3300 EHS-GF series of noncontact pulsed laser rangefinders are...
Riegl Laser Measurement Systems GmbH
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SPECTROPHOTOMETERS
Jun 1, 1997 — Spectrophotometric instruments that include a halogen visible light source and a UV-1 deuterium light source are available from Analytical Instrument Systems Inc. Models DLK-1000 VIS and DLK-1000 UV have wavelength ranges from the VIS to the UV. The...
Analytical Instrument Systems Inc.
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LASER RANGEFINDER
Apr 1, 1997 — Riegl USA is offering the LD 90-3-GF series of pulsed laser rangefinders for low-level altimetry applications. Providing fast and accurate ground-to-aircraft distance measurements, these devices can measure from 3 to 5280 ft with accuracies as high...
Riegl USA Inc.
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OPTICAL METROLOGY TOOL
Apr 1, 1997 — WaveFront Sciences Inc. has introduced the Complete Light Analysis System - 2D, which provides quantitative measurements of both the intensity and phase of any optical source. This vibration-insensitive optical metrology tool is a low-cost baseline...
AMO WaveFront Sciences LLC
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SPECTRUM ANALYZER
Apr 1, 1997 — EXFO E.O. Engineering Inc. has introduced the IQ-5200 Optical Spectrum Analyzer series. Designed for wavelength division multiplexing system design, qualification and monitoring, these devices can also be used to qualify and test optical components....
EXFO Inc.
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AUTOMATIC CIRCLE POLARIMETERS
Mar 1, 1997 — Topac Inc. Instrumentation has introduced the Polartronic series of automatic circle polarimeters from Schmidt and Haensch. Designed to measure the optical activity and concentration of optically active solutes, these microprocessor-controlled...
Topac Inc.
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June 2024
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