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JEOL USA Products
JSM-IT300LV Scanning Electron Microscope
PEABODY, Mass., Sept. 10, 2013 — The JSM-IT300LV scanning electron microscope (SEM) from JEOL USA features an expanded pressure range, large specimen chamber and improved resolution for imaging and characterizing a variety of sample types and sizes. The SEM extends vacuum pressure range to 10 to 650 pA; in low-vacuum mode, this enhances imaging capability for samples that are wet or oily, that outgas excessively or that are nonconductive without pretreatment. The device features multiple ports for analytical...
JEOL USA Inc.
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TFE Scanning Microscope
PEABODY, Mass., Aug. 4, 2008 – JEOL USA has released the JSM-7600F thermal field emission scanning electron microscope to minimize beam damage on heat sensitive samples and to offer improved stability on long-term, unattended data acquisition. Combining high resolution imaging...
JEOL USA Inc.
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CarryScope Mobile SEM
PEABODY, Mass., Jan. 14, 2008 -- JEOL USA Inc. said its new CarryScope is a mobile scanning electron microscope (SEM) that can travel or be easily moved to different locations as needed. According to the company, the CarryScope is the ideal instrument for the mobile crime lab...
JEOL USA Inc.
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MultiBeam SEM-FIB System
PEABODY, Mass. Nov. 29, 2007 -- JEOL USA Inc. said its new high-throughput JIB-4500 MultiBeam SEM-FIB (scanning electron microscope, focused ion beam) combines the high-resolution imaging of the JEOL LaB6 electron column with real-time micromilling and monitoring capability....
JEOL USA Inc.
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JSM-7001F Analytical SEM
PEABODY, Mass., March 13, 2007 -- The JSM-7001F, a new thermal field-emission analytical scanning electron microscope (SEM) from electron optical product maker JEOL USA, acquires high-resolution micrographs at up to 1,000,000X magnification for applications ranging from...
JEOL USA Inc.
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(5 results found)
May 2024
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