NanoWizard Ultra Speed AFM
BERLIN, Dec. 12, 2013 — JPK Instruments AG’s next-generation NanoWizard Ultra Speed AFM (atomic force microscope) delivers fast scanning and superresolution on an inverted microscope for applications including the study of biological or other soft-matter systems.
The device provides real-time tracking changes in samples imaged in air or liquid. Its low-noise scanner, position sensor and detection system enable line-rate scanning speeds >100 Hz in closed-loop mode, while a proprietary Quantitative...
Bruker Nano GmbH, JPK BioAFM