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Veeco Instruments Inc. Products
HIGH-SPEED AFM
Apr 1, 2009 — Veeco Instruments Inc. has unveiled the Dimension Icon atomic force microscope (AFM). Its closed-loop head scans at high speeds and delivers low drift and low noise, decreasing stabilization times and allowing the system to acquire artifact-free...
Veeco Instruments Inc.
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THERMAL ANALYSIS
Jan 1, 2009 — Veeco Instruments Inc.’s Thermal Analysis (VITA) module has been released for the company’s line of scanning probe microscopes. The technology advances nanoscale materials identification by providing characterization capabilities through nanoscale...
Veeco Instruments Inc.
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AFM TECHNIQUE
Jul 1, 2008 — Veeco Instruments Inc. has developed the HarmoniX atomic force microscope (AFM) technique by which users can simultaneously capture quantitative maps of material properties such as elasticity, adhesion, dissipation and peak force. It is available on...
Veeco Instruments Inc.
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MICROSCOPE
Feb 1, 2008 — Designed to meet critical dimension, depth, sidewall angle and chemical mechanical planarization metrology requirements for 45- and 32-nm-node semiconductor processes, the InSight 3DAFM atomic force microscope manufactured by Veeco Instruments Inc....
Veeco Instruments Inc.
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MOCVD SYSTEM FOR PRODUCING LEDS
Dec 1, 2007 — Veeco Instruments Inc. has unveiled the TurboDisc E475 As/P metallorganic chemical vapor deposition (MOCVD) system for the high-volume production of red, orange and yellow high-brightness LEDs and multijunction III-V concentrator solar cells, mainly...
Veeco Instruments Inc.
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SURFACE PROFILING
Nov 1, 2007 — The Wyko SP9900 surface-profiling system from Veeco Instruments Inc. performs measurements that support high yield and device reliability for high-density interconnect packages. The optical metrology system for semiconductor packaging inspection...
Veeco Instruments Inc.
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MICROSCOPE
Sep 1, 2007 — The Innova scanning probe microscope has been released by Veeco Instruments Inc. for use in physical, materials and life sciences applications. It performs low-noise closed-loop scanning and offers easy tip exchange, better than 1-μm-resolution...
Veeco Instruments Inc.
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ATOMIC FORCE MICROSCOPE
Aug 1, 2007 — Veeco Instruments Inc. has announced a series of enhancements to its Dimension X3D automated atomic force microscope. The upgrades include improvements to critical-dimension precision, 3-D profile metrology and line edge roughness metrology. The...
Veeco Instruments Inc.
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PRODUCTION PLATFORM
Mar 1, 2007 — For the production of high-brightness LEDs, Veeco Instruments Inc. has announced its TurboDisc K-series metal organic chemical vapor deposition (MOCVD) gallium nitride platform. The modular and upgradable K300 and K465 models deliver higher...
Veeco Instruments Inc.
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SURFACE PROFILER
Feb 1, 2007 — Veeco Instruments Inc. has launched the Dektak 150 surface profiler for research and industrial metrology applications. Its cast aluminum frame and rigid support elements improve repeatability and lower the noise floor. The standard Z-range of 524...
Veeco Instruments Inc.
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OPTICAL PROFILER
Sep 1, 2006 — The automated Wyko NT3300 optical profiler has been launched by Veeco Instruments Inc. Its dynamic microelectromechanical systems (MEMS) measurement option nondestructively measures MEMS devices as they actuate. The system uses a proprietary...
Veeco Instruments Inc.
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MICROSCOPE CONTROL
Aug 1, 2006 — The NanoScope V extends Veeco Instruments Inc.’s range of scanning probe microscope (SPM) systems. The device achieves reliable high-speed data acquisition of high-density images of 5120 × 5120 pixels. Eight images can be simultaneously captured and...
Veeco Instruments Inc.
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ATOMIC FORCE MICROSCOPE
Apr 1, 2006 — The BioScope II from Veeco Instruments Inc. is an atomic force microscope with a >150-µm X-Y scan range for matching the cell or the sample size to the scan area, and a >15-µm Z range for imaging large structures such as cells. Top-down...
Veeco Instruments Inc.
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ATOMIC FORCE MICROSCOPE
Feb 1, 2006 — Veeco Instruments Inc. has launched the BioScope II atomic force microscope. It delivers a Z-scan range of >15 μm and an X-Y range of >150 μm to facilitate advanced bioscience research. Applications include spatial identification of...
Veeco Instruments Inc.
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MICROSCOPY MODULES
Dec 1, 2005 — Veeco Instruments Inc.s conductive atomic force microscope (AFM) and scanning capacitance microscope (SCM) add-on application modules extend the performance capabilities of its CP-II scanning probe microscope. The conductive AFM can analyze...
Veeco Instruments Inc.
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OPTICAL PROFILER MODULE
Nov 1, 2005 — The Wyko NT series of optical profilers has been extended by Veeco Instruments Inc. with its Through Transmissive Media (TTM) module, which permits high-resolution, noncontact measurement of samples through protective packaging or other transparent...
Veeco Instruments Inc.
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ATOMIC FORCE MICROSCOPY
Mar 1, 2005 — The NanoMan II atomic force microscope from Veeco Instruments Inc. can perform high-accuracy force curves, nanoindenting and pulling techniques, and other nanoscience research. Featuring a patented Hybrid XYZ scanner, the device operates in...
Veeco Instruments Inc.
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MOLECULAR BEAM EPITAXY
Aug 1, 2004 — A molecular beam epitaxy system for materials research and test production of compound semiconductors has been released by Veeco Instruments Inc. The Gen20 system, which has a manual wafer transfer system, features a modular platform that allows...
Veeco Instruments Inc.
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(18 results found)
April 2024
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