JSM-7001F Analytical SEM
PEABODY, Mass., March 13, 2007 -- The JSM-7001F, a new thermal field-emission analytical scanning electron microscope (SEM) from electron optical product maker JEOL USA, acquires high-resolution micrographs at up to 1,000,000X magnification for applications ranging from semiconductors, metals, minerals, materials and ceramics to nonconductive biological samples.
The JSM-7001F features a unique in-lens field emission gun that delivers more than 200 nA of beam current to the sample. An extremely small probe diameter at low kV...
JEOL USA Inc.