Piezo Force Microscopy Module
SANTA BARBARA, Calif., Nov. 29, 2007 -- In the last decade, piezoresponse force microscopy (PFM) has emerged as the preeminent tool for nanoscale imaging, spectroscopy, and manipulation of ferroelectric materials. In response to the growing applications for electromechanical imaging and spectroscopy, Asylum Research said it has developed the new Piezo Force Module, which enables very high sensitivity, high bias, and crosstalk-free measurements of piezoelectrics, ferroelectrics, multiferroics, and biological systems. It is exclusively...
Oxford Instruments Asylum Research