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identification White Papers
Advances in AI for Industrial Inspection
New technology advancements are making it easier for manufacturers to embrace deep learning as part of the inspection process. Today, we train deep learning systems with fewer bad images or even none. While deep learning software for machine vision has been around for more than a decade, it is now becoming more user-friendly and practical. As a result, manufacturers are moving from experimenting with deep learning software to implementing it.
Full-Field Hotspot Detection and High-Resolution Topographic Characterization of Post-CMP Wafers with 3D Optical Profiling
Traditional methods of post-CMP process evaluation have analytical limitations that, in light of tightening process control limits, do not meet the growing need for more accurate wafer surface characterization in semiconductor chip manufacturing....
Easy to use Computer Generated Holograms for Complex Surface Metrology
There are many metrology methods on the market for testing aspheres. The method with one of the highest known accuracies is based on a Fizeau interferometer, in combination with a CGH. We describe a so called DFNL type CGH, having the CGH...
Diamonds are Forever: Using NIR to Find the Fakes
Cubic zirconia is easy and inexpensive to make and the diamond industry has long considered it an existential threat. Consider a diamond crusted band, what if some of those diamonds are actually cubic zirconia? Most people would never be able to...
Machine Learning AI Reduces Inspection Costs
Pleora’s AI Gateway helps organizations quickly realize the business benefits of AI to improve the reliability and lower the cost of visual quality inspection, without costly, time-consuming algorithm development. Designed to work with existing...
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May 2024
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