Register
Sign In
Subscribe
Advertise
Publications
Photonics Spectra
BioPhotonics
Vision Spectra
Photonics Showcase
Photonics Buyers' Guide
Photonics Handbook
Photonics Dictionary
Newsletters
Bookstore
News & Features
Latest News
Latest Products
Features
All Things Photonics Podcast
By Technology
Lasers & Light Sources
Optics
Materials & Coatings
Imaging
Sensors & Detectors
Test & Measurement
Integrated Photonics
Spectroscopy
Biophotonics
Machine Vision
Marketplace
Supplier Search
Product Search
Career Center
Webinars & Events
Webinars
Photonics Media Virtual Events
Industry Events Calendar
Resources
White Papers
Videos
Contribute an Article
Suggest a Webinar
Submit a Press Release
Subscribe
Advertise
Become a Member
Publications
Photonics Spectra
BioPhotonics
Vision Spectra
Photonics Showcase
Photonics Buyers' Guide
Photonics Handbook
Photonics Dictionary
Newsletters
Bookstore
News & Features
Latest News
Latest Products
Features
All Things Photonics Podcast
By Technology
Lasers & Light Sources
Optics
Materials & Coatings
Imaging
Sensors & Detectors
Test & Measurement
Integrated Photonics
Spectroscopy
Biophotonics
Machine Vision
Marketplace
Supplier Search
Product Search
Career Center
Webinars & Events
Webinars
Photonics Media Virtual Events
Industry Events Calendar
Resources
White Papers
Videos
Contribute an Article
Suggest a Webinar
Submit a Press Release
Subscribe
Advertise
Become a Member
Register
Sign In
submit product
optical microscope Products
Measuring Microscope
PROVIDENCE, R.I., Nov. 10, 2014 — A new optical measuring microscope with image processing capability from Mahr Federal is designed for the measurement and dimensioning of geometric elements. The MarVision QM 300 features a 5-MP color CCD color camera with a 40-mm adjustable...
Mahr Inc.
Request info >
Optical Microscope
TUCSON, Ariz., March 27, 2013 — Bruker Corp. has released the ContourGT-K, the latest addition to its ContourGT line of 3-D optical microscopes The scalable device features patented, higher-brightness dual-LED illumination and vertical resolution for uncompromised benchtop...
Bruker Nano Surfaces
Request info >
Particle Measurement System
CENTER VALLEY, Pa., Dec. 21, 2012 — Designed to provide customers with a streamlined solution for quantifying microscopic residue, defects and foreign particles during manufacture, Olympus America Inc.’s Inspector Series 5.2 delivers the accurate and reproducible data required...
Evident
Request info >
Inspector Series 5.2
CENTER VALLEY, Pa., Dec. 4, 2012 — Designed for quantifying microscopic residue, defects and foreign particles, the Inspector Series 5.2 released by Olympus America Inc. delivers accurate and reproducible data that determines whether manufactured parts meet quality specifications. It...
Evident
Request info >
Surface Measuring System
BERGISCH GLADBACH, Germany, Oct. 7, 2012 — Fries Research and Technology GmbH’s MicroScope WLI (white light interferometry) is a surface measuring system based on an optical microscope. It is supplied with a full white light interferometer for nondestructive measurement, enabling 3-D...
FormFactor
Request info >
Superresolution Microscope
Jan 1, 2011 — Nikon Instruments Inc. has released the N-SIM, a superresolution microscope that operates at speeds enabling the study of microstructures and nanostructures of fixed and living cells with molecular-scale resolution. Based on the Eclipse Ti inverted...
Nikon Instruments Inc.
Request info >
Extension of Microscope Series
ULM, Germany, April 6, 2010 — WITec GmbH has introduced an extension of its alpha300 microscope series. Building on the system’s inherent modularity, the company has added several new microscope versions to meet diverse customer requirements. In the field of Raman...
WITec GmbH
Request info >
Lid Alignment, Tack Welding Station
MONROVIA, Calif., Oct. 10, 2007 -- Miyachi Unitek Corp.'s Unitek Benchmark division said its new lid alignment and tack welding station provides accurate tacking of lids to package bases. The standard station includes a precision slide which allows for separate alignment and tacking...
AMADA WELD TECH Inc.
Request info >
(8 results found)
April 2024
Subscribe
Advertise
Issue Library
Latest News
16th Biannual Optatec Conference Continues in Frankfurt
Apr 30, 2024
Celestial Surface Mapping Tech Combines Established Techniques
Apr 30, 2024
TSMC Partnerships Target Integrated Photonics Capabilities
Apr 30, 2024
CLEO Heads to the East Coast
Apr 29, 2024
Laser-Based Gas Analyzer Developed to Detect Air Pollution
Apr 29, 2024
Qubits Could be Stored in Flash-Like Memory
Apr 29, 2024
Exail Signs LLNL Contract, Partners with Eelume
Apr 26, 2024
Menlo Moves U.S. HQ: Week in Brief: 4/26/2024
Apr 26, 2024
Optofluidics Platform Keys Label-, Amplification-Free Rapid Diagnostic Tool
Apr 25, 2024
DUV Lasers Made with Nonlinear Crystals Enhance Lithography Performance
Apr 25, 2024
Features
3D-Stacked CMOS Sparks Imaging’s Innovation Era
Photonics Spectra
, Apr 2024
Software-Defined Photonics Orchestrates Light in Future Data Centers
Photonics Spectra
, Apr 2024
A Quantum Leap for Sensitive Gas Analysis
Photonics Spectra
, Apr 2024
Explore Our Content
News
Features
Latest Products
Webinars
White Papers
All Things Photonics Podcast
Videos
Our Summits & Conferences
Industry Events
Bookstore
Join Our Community
Subscribe
Advertise
Become a member
Sign in
Contribute a Feature
Suggest a Webinar
Submit a Press Release
Mobile Apps
About Us
Our Company
Our Publications
Contact Us
Career Opportunities
Teddi C. Laurin Scholarship
Terms & Conditions
Privacy Policy
California Consumer Privacy Act (CCPA)
©2024 Photonics Media
100 West St.
Pittsfield, MA, 01201 USA
[email protected]
We use cookies to improve user experience and analyze our website traffic as stated in our
Privacy Policy
. By using this website, you agree to the use of
cookies
unless you have disabled them.