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scanning electron microscopes Products
EVO Series SEMs
JENA, Germany, Oct. 7, 2013 — Carl Zeiss Group’s next-generation EVO series scanning electron microscopes (SEMs) deliver work-flow automation, beam-deceleration technology and high-definition imaging for materials and life sciences applications. Work flow is...
Carl Zeiss Spectroscopy GmbH
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Life Sciences Software
BESANÇON, France, Sept. 17, 2012 — For surface imaging and metrology compatible with scanning electron microscopes (SEMs) and multispectral Raman instruments, Digital Surf has announced a new generation of Mountains 7 software. Compatibility with scanning profilometers and form...
Digital Surf
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SoftClean Specimen Cleaner
REDWOOD CITY, Calif., May 2, 2011 — For use with its Evactron decontaminator plasma cleaning system for electron microscopes and other vacuum chambers, XEI Scientific Inc. has introduced the SoftClean specimen cleaning chamber. Electron microscopy imaging can be degraded by...
XEI Scientific Inc.
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SAMPLE PREPARATION
Sep 1, 2005 — The SM-09010 cross-section polisher from JEOL USA Inc. prepares smooth, thin specimens of materials for examination under scanning electron microscopes. It is suitable for the preparation of samples of layered and composite structures, including...
JEOL USA Inc.
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ELECTRON BEAM MODULES
Aug 1, 2004 — The EBM series triode modules have been developed by Spellman High Voltage Electronics Corp. to drive electron beam columns for scanning electron microscopes. In a package made compact by surface-mount and proprietary encapsulation technologies, the...
Spellman High Voltage Electronics Corp.
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CHILLER
Dec 1, 2003 — The ThermoCube chiller from Solid State Cooling Systems provides precise temperature control for laboratories, scanning electron microscopes and lasers. It measures 1 cu ft, accepts 115- and 230-VAC input, and operates with standard aqueous coolants...
Solid State Cooling Systems
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May 2024
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