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scanning probe microscopy News
Nanotech instruments
Dec 1, 2008 — A supplier of nanoanalytic instrumentation for research in the life sciences and soft matter, JPK Instruments AG has launched a redesigned Web site that reflects its expanded product range. The portal provides information on applications of scanning...
Determining the Composition of Quantum Dots from Top to Bottom
Jul 1, 2008 — Quantum dots may shine, but shedding light on their make-up has proved to be difficult because they are small, with sizes in the tens of nanometers. Several analysis techniques average over many quantum dots, smoothing out possible variations....
Asylum Research Buys Majority Stake in Atomic Force F&E
SANTA BARBARA, Calif., April 20, 2007 -- Asylum Research, a maker of atomic force and scanning probe microscopes, announced it has purchased a majority interest in Germany-based Atomic Force F&E GmbH, its distributor in Europe. Specific terms were not disclosed. Atomic Force...
POSITIONERS
Jul 1, 2006 — The 215-page “Product Catalog 2005 & 2006” from attocube systems AG details the company’s nanopositioners for applications such as sample positioning in scanning probe microscopy, including low-temperature microscopes equipped with...
Daily News Briefs
Oct 18, 2004 — David Emma has been named vice president, OEM and licensing, at Color Kinetics Inc., a Boston-based designer of solid-state lighting systems and technologies. Emma most recently was vice president of the Communications Modules Division of Integrated...
Near-Field Scanning Optical Microscopy and Spectroscopy Advance
Feb 1, 2004 — Although the rapid advance of scanning probe microscopy in the 1990s enabled routine imaging of unaltered samples at unprecedented nanoscale resolution, researchers still could not uniquely identify the chemical composition of materials and unveil...
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