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scanning probe microscopy White Papers
Resonant Probe AFM: Uses and Advantages
A resonant probe atomic force microscope (AFM) offers capabilities and benefits not found in commonly used optical deflection AFMs in the measurement of physical constants, physical properties, and surface morphology. This article discusses resonant probe AFM construction, functionality. Some of the applications particularly well suited to resonant probe AFM are optical antenna properties, quantum materials (NV center research), and terahertz microscopy/spectroscopy.
Principles of Scanning Nitrogen-Vacancy Magnetometry Explained
Scanning nitrogen-vacancy (NV) magnetometry is a measurement technique that combines scanned probe microscopy (SPM) with optically detected magnetic resonance (ODMR) to image magnetic field distribution with high spatial resolution (<50 nm). This...
Principles of Boxcar Averaging
In this white paper, we illustrate the working principle of a digital boxcar averager, elucidate the relevant measurement parameters, present the state of the art, and provide guidelines for the best choice of measurement technique when working with...
(3 results found)
April 2024
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