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surface measurement Webinars
on demand
The Technology-Enabling Power of Dynamic Interferometry
Surface and wavefront measurements demand increasing precision and accuracy as specifications tighten on high-performance components. This is true even when production or test environments are...
on demand
Rethinking Scratch-and-Dig Specifications
The scratch-and-dig specification, described in the MIL-PRF-13830B standard, has been the de facto method of controlling surface imperfections on optics for most components and systems since it was...
on demand
Optical Metrology Solutions for the Semiconductor and Microelectronic Industries
This webinar will discuss specific analysis for QC in PCB applications. It will also cover critical dimensional measurement, roughness, and defect identification. Presenters Adam Platteis and Alberto...
(3 results found)
May 2024
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