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white-light interferometry Products
MIPOS 16-158 Z-Axis Positioner
JENA, Germany, Feb. 27, 2013 — piezosystem jena is offering the MIPOS 16-158 Z-axis positioner for high-precision positioning of optical systems with accuracy in the subnanometer range. The high resolution, fast response time, 158-mm aperture and stage height of 42 mm offer new...
piezosystem jena GmbH
Request info >
Linear Stages
Oct 1, 2011 — Newport Corp. has launched the FMS series precision linear motion control stages. Designed for use in surface profiling, tribology, and contact (stylus) and noncontact metrology (white-light interferometry), the compact stainless steel stages permit...
MKS/Newport
Request info >
FMS Precision Linear Stages
IRVINE, Calif., July 22, 2011 — Newport Corp. has launched the FMS series precision linear motion control stages. They are designed for use in surface profiling, tribology, and contact (stylus) and noncontact metrology (white-light interferometry). The stainless steel stages...
MKS/Newport
Request info >
Spectral Filter
May 1, 2011 — For optical coherence tomography (OCT) and white-light interferometry (WLI) applications, NKT Photonics A/S has introduced the SuperK Gauss spectral filter for use with SuperK Extreme supercontinuum lasers. It transforms the broadband output of the...
NKT Photonics A/S
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SuperK Gauss Spectral Filter
BIRKERØD, Denmark, March 4, 2011 — For optical coherence tomography (OCT) and white-light interferometry (WLI) applications, NKT Photonics A/S has launched the SuperK Gauss spectral filter for use with SuperK Extreme supercontinuum lasers. It transforms the broadband output of the...
NKT Photonics A/S
Request info >
Surface Metrology System
Apr 12, 2010 — The NT9080, a surface metrology system introduced by Veeco Instruments Inc., uses white-light interferometry to measure surface topography nondestructively, from nanometer-scale roughness through millimeter-scale steps, with subnanometer vertical...
Veeco Instruments Inc.
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(6 results found)
April 2024
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