Search
Menu
BAE Systems Sensor Solutions - Fairchild - Thermal Imaging Solutions 4/24 LB

Characterization of SERRS Nanoparticles Using UV-Vis and Raman Spectroscopy

Facebook X LinkedIn Email
Thursday, September 21, 2023
Edinburgh Instruments Ltd.

Surface-enhanced resonance Raman scattering (SERRS) is a technique that offers unparalleled sensitivity and specificity in nondestructive spectroscopic detection. It combines surface-enhanced Raman scattering (SERS) and resonance Raman spectroscopy (RRS), two techniques that are individually used to overcome the inherent weakness of Raman scattering.

Download Application Note
File: Edinburgh_Instruments_Characterization_of_SERRS_Nanoparticles.pdf (2.90 MB)
To download this application note, please complete the *required fields before clicking the "Download" button.
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:




When you click "Download", you agree that your personal contact information may be shared with Edinburgh Instruments Ltd. and they may contact you about their products and services in the future. You also agree that Photonics Media may contact you with information related to this request, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required
ImagingRaman spectroscopyRamanSERRSUV-VisRaman microscopeRaman microscopyspectrophotometerUV-Vis AnalysisUV-Vis spectroscopy
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.