Photonics Dictionary

A device utilizing an electron beam for the observation and recording of submicroscopic samples with the aid of photographic emulsions or other short-wavelength sensors. With the electron microscope,...

An imaging device whose technology contributes three specific advantages: ability to study large solid specimens that exhibit behavior in bulk; conduction of in situ studies of radiation damage; and...

An electron microscope that uses a beam of electrons -- accelerated to high energy and focused on the sample -- to scan the sample surface, ejecting secondary electrons that form the picture of the...

A type of microscope that uses magnetic lenses to transmit a beam of electrons through an object; the electrons are then focused on a fluorescent screen to form an enlarged image.

A device that uses four electrodes set in an alternating positive-negative polarity series to focus the beams of charged particles employed in electron microscopes and particle accelerators.

The photographic recording of images produced by the electrons from an electron microscope. The electron beam carries the images through an array of three lenses, and an enlarged electron image is...

An electron-gun system is an assembly used to generate and control a focused beam of electrons. Electron guns find applications in various fields, including cathode ray tubes (CRTs), electron...

A type of electron microscope in which the specimen also serves as the cathode source.

The analysis of metal structure using an optical or electron microscope, generally with a camera, to record observations.

Microscopy is a scientific technique that involves the use of microscopes to observe and study objects that are too small to be seen with the naked eye. Microscopes are instruments that magnify and...

A device used in electron microscopes and particle accelerators to focus electron beams by the arrangement of four electrodes of alternating signs around the electron beam.

The picture formed by the scanning beam of electrons in a scanning electron microscope.

A nondestructive testing method for very large scale integration circuits, using a scanning electron microscope to monitor changes in the electronic state of the chip as it is fed test voltages while...

The method of acquiring characteristic x-ray spectra from microscopic samples by use of the combination of a scanning electron microscope and x-ray spectroscopy.