Search
Menu
Photonics Marketplace

Show Filters
Hide Filters
Suppliers by Category

Regions

US States

Countries

18 suppliers

Other Interferometers

Clear All Filters xOther Interferometers x
AOM - Arizona Optical Metrology
AOM - Arizona Optical Metrology - Tucson, AZ
Provides measurement solutions for optical surfaces and systems. Custom metrology for measuring surface figure error, precision alignment, and transmitted wavefront error. Products include computer-generated holograms (CGHs) for interferometric measurement of aspheric and freeform surfaces, mechanics, and accessories for enabling CGH measurements.
Custom ManufacturerSupplier/DistributorDesigner
Bruker Nano Surfaces
Bruker Nano Surfaces - Tucson, AZ
Extensive suite of application-focused instrumentation for life sciences and materials research and production covers the full range of metrology techniques, sample sizes, and imaging resolutions. Technologies include AFMs, NanoIR spectrometers, fluorescence microscopes, stylus and optical profilers, mechanical testers, and nano-indenters.
Supplier/Distributor
Data-Pixel - Chavanod, France
Difrotec OU - Tartu, Estonia
Imagine Optic - Orsay, France
Interferometric Optics - Jonesborough, TN
Kohzu Precision Co. Ltd. - Kawasaki, Japan
Metrology Concepts - Rochester, NY
NIREOS - Milan, Italy
nortus Optronic GmbH - Woerth am Rhein, Germany
Opt-E - Tucson, AZ
Optical Measurement Systems Corp. - Laguna Hills, CA
Optocraft GmbH - Erlangen, Germany
QED Technologies Inc. - Rochester, NY
Stanford Photo-Thermal Solutions - Pahoa, HI
TOPTICA Photonics Inc. - Pittsford, NY
Verity Instruments Inc. - Carrollton, TX
Wyse Light - Saint-Etienne, France
Glossary
  • interferometer An instrument that employs the interference of lightwaves to measure the accuracy of optical surfaces; it can measure a length in terms of the length of a wave of light by using interference phenomena based on the wave characteristics of light....
  • surface profile A representation of the shape of a surface, including any roughness or other irregularities. The profile can be generated by direct measurements, as by a stylus, or by remote measurement, as by an interferometer.
Other Interferometers Suppliersinterferometerslaser interferometerssurface profilinglummer gehrcke platessurface measurementoptical surface measurementinterference of light waveswavefront sensingopticstest & measurement

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.