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Scanning Electron Microscopes (SEM)

A scanning electron microscope is a powerful imaging instrument used in scientific research, materials characterization, and various industrial applications. Unlike traditional optical microscopes, which use visible light to magnify and image specimens, SEMs use a focused beam of electrons to generate high-resolution images of a sample's surface. Learn more about scanning electron microscopes →

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Capovani Brothers Inc. - Scotia, NY
CIQTEK - Hefei, China
Circuit Insights LLC - Pasadena, CA
Delmic BV - Delft, Netherlands
El-Mul Technologies Ltd. - Rehovot, Israel
Electron Optics Instruments (EOI) LLC - West Orange, NJ
Hitachi High-Tech America Inc., Life Sciences and Nanotechnology - Dallas, TX
Imina Technologies SA - Cugy, Switzerland
JEOL USA Inc. - Peabody, MA
NanoImages - Lafayette, CA
Norcada Inc. - Edmonton, Canada
Particle Technology Labs (PTL) - Downers Grove, IL
Quartz Imaging Corp. - Vancouver, Canada
Raith America Inc. - Islandia, NY
SEMTech Solutions Inc. - North Billerica, MA
Staib Instruments Inc. - Williamsburg, VA
Carl Zeiss Microscopy GmbH, Microscopy - Jena, Germany
Glossary
  • scanning electron microscope A scanning electron microscope (SEM) is a powerful imaging instrument used in scientific research, materials characterization, and various industrial applications. Unlike traditional optical microscopes, which use visible light to magnify and image...
Scanning Electron Microscopes (SEM) Supplierselectron microscopebeam electronssecondary electronsSEMinspection microscopeelectron microscopyresearch instrumentsramanmicro scopemicroscopyimagingtest & measurement

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