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Swiss Federal Institute of Technology

Measurement of shape, roughness, displacement and deformation using holographic, speckle and fringe projection techniques. Demodulation and processing of interference patterns and signals.
Nanophotonics & Metrology Laboratory - NAM
EPFL-STI-NAM, Station 11
CH-1015 Lausanne
phone:+41 21 693 47 46
fax:+41 21 693 26 14

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