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8 products
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Contour Elite I
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Max Scan:
73 μm / sec
Max Scan Range:
≤10mm
Sample Height:
Up to 100 mm (4 in.)
Dektak XTL
Bruker Nano Surfaces
Type:
Optical
Stylus Force:
0.03 mg to 15 mg
Vertical Range:
1 mm
Vertical Resolution:
1Å max. (@6.55 µm range)
Contour Elite K
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Max Scan:
47 μm/sec
Max Scan Range:
>10 mm
Sample Height:
Up to 100 mm
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
Type:
Scanning Probe
S wide
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
Display Resolution:
0.001 µm
Max. Extended Measuring area:
300 × 300 mm
Vertical Measuring Range:
40 mm
S neox Five Axis
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
S neox
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
S mart
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
Microscope Systems Products
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