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11 products
Microscope Systems
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Microscopy x
Microscope Systems x
BC43 CF
Andor Technology
Type:
Optical
Core Imaging Modes:
Widefield epifluorescence. Transmitted light - brightfield and differential phase contrast
Imaging Methods:
Single color, multicolor, z-stacking (volume), time-lapse, multi-position, multi-well, montage and 2/3D stitching
Imaging Modes:
3
Modular Infinity Microscope (MIM) System
Applied Scientific Instrumentation Inc.
Type:
Optical
Beamsplitter:
Olympus AX/BX/IX series
Camera Port:
C, T, F and ENG Mounts
Tube Lens:
Nikon, 100, 120, 300 mm
Spero® QCL-IR Microscope
DRS Daylight Solutions Inc.
Type:
Optical
Spectral Range:
MWIR
Image Acquisition Time:
< 40 s for image cube
Imaging Modes:
Transmission and Reflection
Spectral Resolution:
Variable, down to 2 cm-1
MultiMode 8-HR
Bruker Nano Surfaces
Type:
Scanning Probe
Imaging Noise Level:
<30 pm rms
Maximum Sample Size:
15 mm dia × 5 mm thick
Dimension FastScan
Bruker Nano Surfaces
Type:
Scanning Probe
Integral Nonlinearity XYZ:
<0.50%
X-Y Scan Range:
90 μm × 90 μm typical
Z Range:
10 μm typical in imaging
Dimension Edge
Bruker Nano Surfaces
Type:
Scanning Probe
X-Y Scan Range:
85 μm minimum
Z Range:
9.5 μm minimum
DektakXT
Bruker Nano Surfaces
Type:
Optical
Data Points Per Scan:
120,000 max.
Stylus Force:
1 to 15 mg with LIS 3 sensor
Vertical Range:
1 mm
Dektak XTL
Bruker Nano Surfaces
Type:
Optical
Stylus Force:
0.03 mg to 15 mg
Vertical Range:
1 mm
Vertical Resolution:
1Å max. (@6.55 µm range)
Dimension Icon
Bruker Nano Surfaces
Type:
Scanning Probe
Integral nonlinearity XYZ:
<0.5% typical
X-Y scan range:
90 μm x 90 μm typical
Z range:
10 μm typical in imaging
Tungsten Filament Scanning Electron Microscope SEM3200
CIQTEK
Type:
Electron
Acceleration Voltage:
0.2 kV-30 kV
Extension:
SE\BSE\EDS\EDX\EBSD, etc.
Low Vacuum Mode:
3 nm @ 30 kV (SE)
S neox
Sensofar Metrology
Type:
Optical
Spectral Range:
VIS
Microscope Systems Products
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